Ing. - 1972,
CSc. - 1977,
Doc. - 1991,
Prof. - 1998
with the Czech Technical University in Prague - Faculty of Electrical Engineering - since 1972
Vice head of the Department of Measurement of the Czech Technical University in Prague - Faculty of Electrical Engineering (CTU-FEE), member of the State Examination Board at the FEE, Chairman of the PhD study Committee for Measurement and Instrumentation at the CTU-FEE, member of the Technical commissions of standardisation TNK 12 "Quantities and Values" of the Czech Institute of Standardisation, member of the IMEKO (International Measurement Confederation) TC-4 - Measurement of Electrical Quantities, member of the IEEE Instrumentation & Measurement Society - TC-10 - Waveform Generation, Measurement and Analysis, member of the Editorial Board of the int. journal "Metrology and Measurement systems".
Other activities: Chairman of the Council of Czech Universities, Vice-Chairman of the Research and Development Council, member of the Academic Assembly of the Czech Academy of Science, member of the Academic Senate of the Czech Technical University in Prague.
Publication activity: 9 textbooks, 3 monograph (co-author) and about 110 original assessed articles in scientific periodicals and conference proceedings with full text review (more then 50 % in English).
Lectures in courses: Electrical Measurements
Haasz, V. - Slepička, D.: High-Quality Low-Cost Low-Frequency Filter for ADC Testing. In XIX IMEKO World Congress 2009 - Fundamental and Applied Metrology [CD-ROM]. Lisbon: Instituto Superior Técnico/Instituto de Telecomunicaçoes Portugal, 2009, p. 558-561. ISBN 978-963-88410-0-1.
Suchánek, P. - Slepička, D. - Haasz, V.: Several Approaches to ADC Transfer Function Approximation and their Application for ADC Non-Linearity Correction. Metrology and Measurement Systems. 2008, vol. 15, no. 4, p. 501-511. ISSN 0860-8229.
Haasz, V. - Slepička, D. - Suchánek, P.: Models of the ADC Transfer Function - Sensitivity to Noise. In IMTC - International Instrumentation and Measurement Technology Conference Proceedings [CD-ROM]. Victoria: IEEE, 2008, p. 583-587. ISBN 978-1-4244-1540-3.
Haasz, V. - Komárek, M. - Roztočil, J. - Slepička, D. - Suchánek, P.: Influence of Test Signal Phase Noise on High-Resolution ADC Testing. In IMTC/2007 IEEE Instrumentation and Measurement Technology Conference Proceedings [CD-ROM]. Warsaw: IEEE, 2007, ISBN 1-4244-1080-0.
Haasz, V. - Komárek, M. - Roztočil, J. - Slepička, D. - Suchánek, P.: System for Testing Middle-Resolution Digitizers Using Test Signal up to 20 MHz. In IMTC/06 Proceedings of the 23rd IEEE Instrumentation and Measurement Technology Conference [CD-ROM]. Sorrento: IEEE, 2006, p. 266-270. ISBN 0-7803-9360-0.
Haasz, V.: Testing of High-Resolution/Middle-Speed A/D Converters and Modules - Problems and Ways of Solving them. Computer Standards & Interfaces. 2005, vol. 28, no. 2, p. 194-203. ISSN 0920-5489.
Haasz, V. - Roztočil, J. - Slepička, D.: Evaluation of ADC Testing Systems Using ADC Transfer Standard. IEEE Transactions on Instrumentation and Measurement. 2005, vol. 54, no. 3, p. 1150-1155. ISSN 0018-9456.
Haasz, V. - Slepička, D. - Komárek, M. - Roztočil, J.: System for the Testing of High-resolution ADCs at Frequency of 1 MHz. In IMTC05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference [CD-ROM]. Ottawa: IEEE Instrumentation & Measurement Society IEEE Ottawa Section, 2005, p. 278-281. ISBN 0-7803-8880-1.
Haasz, V. - Slepička, D.: Frequency Spectrum Correction Method for the ADC Testing. In IMTC/04 Proceedings of the 21th IEEE Instrumentation and Measurement Technology Conference. Como: IEEE Instrumentation and Measurement Society, 2004, s. 533-536. ISBN 0-7803-8248-X.